Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10359613 | Optical measurement of step size and plated metal thickness | Ronny Soetarman, Budi Hartono | 2019-07-23 |
| 10209501 | 3D microscope and methods of measuring patterned substrates | Zhen Hou, Ken Kinsun Lee, James Nelson Stainton, Hung Phi Nguyen, Rusmin Kudinar +1 more | 2019-02-19 |
| 10168524 | Optical measurement of bump hieght | Ronny Soetarman | 2019-01-01 |