Issued Patents 2019
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10297419 | Scanning electron microscope with charge density control | Hajime Kawano | 2019-05-21 |
| 10249474 | Charged particle beam device | Toshiyuki Yokosuka, Chahn Lee, Hideyuki Kazumi, Hajime Kawano, Kumiko Shimizu +1 more | 2019-04-02 |