Issued Patents 2019
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10504609 | Semiconductor device and diagnosis method thereof | Hideshi Maeno, Jun Matsushima | 2019-12-10 |
| 10295597 | Semiconductor device and scan test method including writing and reading test data | Jun Matsushima, Hiroki Wada | 2019-05-21 |
| 10288683 | Semiconductor device, electronic control system and method for evaluating electronic control system | Jun Matsushima | 2019-05-14 |
| 10281525 | Semiconductor device and diagnostic test method for both single-point and latent faults using first and second scan tests | Jun Matsushima, Takayuki Suzuki | 2019-05-07 |
| 10254342 | Semiconductor device | Susumu Abe, Yoshitaka Taki | 2019-04-09 |