Issued Patents 2019
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10504609 | Semiconductor device and diagnosis method thereof | Yoichi Maeda, Hideshi Maeno | 2019-12-10 |
| 10295597 | Semiconductor device and scan test method including writing and reading test data | Yoichi Maeda, Hiroki Wada | 2019-05-21 |
| 10288683 | Semiconductor device, electronic control system and method for evaluating electronic control system | Yoichi Maeda | 2019-05-14 |
| 10281525 | Semiconductor device and diagnostic test method for both single-point and latent faults using first and second scan tests | Yoichi Maeda, Takayuki Suzuki | 2019-05-07 |