Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10488767 | Alignment system wafer stack beam analyzer | Igor Matheus Petronella Aarts, Justin Kreuzer, Irit Tzemah | 2019-11-26 |
| 10338481 | Polarization independent metrology system | Justin Kreuzer | 2019-07-02 |