Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10488767 | Alignment system wafer stack beam analyzer | Krishanu SHOME, Justin Kreuzer, Irit Tzemah | 2019-11-26 |
| 10481507 | Measurement method comprising in-situ printing of apparatus mark and corresponding apparatus | Kevin J. Violette, Haico Victor Kok, Eric Brian Catey | 2019-11-19 |