Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10522327 | Method of operating a charged particle beam specimen inspection system | Gilad Erel, Michal Avinun-Kalish | 2019-12-31 |
| 10168614 | On-axis illumination and alignment for charge control during charged particle beam inspection | Alex Goldenshtein | 2019-01-01 |