Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10168614 | On-axis illumination and alignment for charge control during charged particle beam inspection | Stefan Lanio | 2019-01-01 |
AG
Alex Goldenshtein
Ict Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh: 1 patents #3 of 9Top 35%
Overall (2019): #551,285 of 560,194Top 100%
1
Patents 2019