Issued Patents 2019
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10365132 | Methods and systems for performing test and calibration of integrated sensors | Mitesh Agrawal, Preetham M. Lobo, John D. Parker, Gerard M. Salem, Tobias Webel | 2019-07-30 |
| 10254336 | Iterative N-detect based logic diagnostic technique | Mary P. Kusko, Gary W. Maier, Phong T. Tran | 2019-04-09 |
| 10247776 | Structurally assisted functional test and diagnostics for integrated circuits | Mary P. Kusko, Gerard M. Salem | 2019-04-02 |
| 10209306 | Methods and systems for generating functional test patterns for manufacture test | John D. Parker, Gerard M. Salem | 2019-02-19 |
| 10203371 | Methods and systems for generating functional test patterns for manufacture test | John D. Parker, Gerard M. Salem | 2019-02-12 |
| 10169510 | Dynamic fault model generation for diagnostics simulation and pattern generation | Mary P. Kusko, Gary W. Maier, Phong T. Tran | 2019-01-01 |