Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10386180 | Apparatus and method for measuring thin material thicknesses in inventory management applications | Johan U. Backstrom, Iouri Markevitch, Ian Baron | 2019-08-20 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10386180 | Apparatus and method for measuring thin material thicknesses in inventory management applications | Johan U. Backstrom, Iouri Markevitch, Ian Baron | 2019-08-20 |