Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10386180 | Apparatus and method for measuring thin material thicknesses in inventory management applications | Sebastien Tixier, Johan U. Backstrom, Ian Baron | 2019-08-20 |
| 10180342 | Level finding using multiple search steps | Johan U. Backstrom, Sarabjit Singh, Stephane Savard, Michael Kon Yew Hughes, Frank M. Haran | 2019-01-15 |