Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10317368 | Defect inspection device and defect inspection method | Hisashi Endou, Hiroyuki Takagi, Mitsuteru Inoue | 2019-06-11 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10317368 | Defect inspection device and defect inspection method | Hisashi Endou, Hiroyuki Takagi, Mitsuteru Inoue | 2019-06-11 |