Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10317368 | Defect inspection device and defect inspection method | Hisashi Endou, Taichi GOTO, Mitsuteru Inoue | 2019-06-11 |
| 10177971 | Operation management device and method | Naohiro Tamura | 2019-01-08 |