Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10515778 | Secondary particle detection system of scanning electron microscope | Sumio Sasaki, Susumu Takashima, Makoto Kato, Yukihiro Tanaka, Yuichiro Yamazaki | 2019-12-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10515778 | Secondary particle detection system of scanning electron microscope | Sumio Sasaki, Susumu Takashima, Makoto Kato, Yukihiro Tanaka, Yuichiro Yamazaki | 2019-12-24 |