Issued Patents 2019
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10488184 | Interferometric characterization of surface topography | Kevin Eduard Heidrich, John Allgair, Jonathan Peak | 2019-11-26 |
| 10254110 | Via characterization for BCD and depth metrology | Ke Xiao, Brennan Peterson | 2019-04-09 |