WD

Walter van Dijk

FE Fei: 1 patents #19 of 103Top 20%
Overall (2019): #227,148 of 560,194Top 45%
1
Patents 2019

Issued Patents 2019

Patent #TitleCo-InventorsDate
10340113 Studying dynamic specimen behavior in a charged-particle microscope Erik René Kieft 2019-07-02