EK

Erik René Kieft

FE Fei: 1 patents #19 of 103Top 20%
Overall (2019): #474,753 of 560,194Top 85%
1
Patents 2019

Issued Patents 2019

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10340113 Studying dynamic specimen behavior in a charged-particle microscope Walter van Dijk 2019-07-02