PT

Peter Christiaan Tiemeijer

FE Fei: 5 patents #1 of 103Top 1%
📍 Eindhoven, OR: #1 of 2 inventorsTop 50%
Overall (2019): #31,417 of 560,194Top 6%
5
Patents 2019

Issued Patents 2019

Showing 1–5 of 5 patents

Patent #TitleCo-InventorsDate
10522323 Electron energy loss spectroscopy with adjustable energy resolution 2019-12-31
10453647 Emission noise correction of a charged particle source Ali Mohammadi-Gheidari, Luigi Mele, Gerard Nicolaas Anne van Veen, Hendrik Nicolaas Slingerland 2019-10-22
10431420 Post column filter with enhanced energy range Alexander Henstra 2019-10-01
10410827 Gun lens design in a charged particle microscope Ali Mohammadi-Gheidari, Alexander Henstra, Kun Liu, Pleun Dona, Gregory A. Schwind +1 more 2019-09-10
10224174 Transmission charged particle microscope with imaging beam rotation Bert Henning Freitag, Maarten Bischoff 2019-03-05