AM

Ali Mohammadi-Gheidari

FE Fei: 2 patents #4 of 103Top 4%
📍 Best, NL: #4 of 32 inventorsTop 15%
Overall (2019): #194,618 of 560,194Top 35%
2
Patents 2019

Issued Patents 2019

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
10453647 Emission noise correction of a charged particle source Luigi Mele, Peter Christiaan Tiemeijer, Gerard Nicolaas Anne van Veen, Hendrik Nicolaas Slingerland 2019-10-22
10410827 Gun lens design in a charged particle microscope Alexander Henstra, Peter Christiaan Tiemeijer, Kun Liu, Pleun Dona, Gregory A. Schwind +1 more 2019-09-10