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Naohisa Nishioka

LL Longitude Licensing Limited: 1 patents #1 of 15Top 7%
Micron: 1 patents #513 of 1,093Top 50%
Overall (2019): #136,125 of 560,194Top 25%
2
Patents 2019

Issued Patents 2019

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
10468313 Apparatuses and methods for TSV resistance and short measurement in a stacked device 2019-11-05
10181347 Semiconductor device, adjustment method thereof and data processing system Chikara Kondo 2019-01-15