JT

Joachim Tabary

CEA: 3 patents #37 of 857Top 5%
Overall (2019): #83,481 of 560,194Top 15%
3
Patents 2019

Issued Patents 2019

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
10386508 Method of calibrating an X ray diffraction analysis system Damien Barbes, Caroline Paulus 2019-08-20
10371651 Method for analyzing an object by X-ray diffraction Damien Barbes, Caroline Paulus 2019-08-06
10352882 Method and system for analyzing an object by diffractometry using a scattering spectrum and a transmission spectrum Caroline Paulus 2019-07-16