Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10386508 | Method of calibrating an X ray diffraction analysis system | Joachim Tabary, Damien Barbes | 2019-08-20 |
| 10371651 | Method for analyzing an object by X-ray diffraction | Damien Barbes, Joachim Tabary | 2019-08-06 |
| 10352882 | Method and system for analyzing an object by diffractometry using a scattering spectrum and a transmission spectrum | Joachim Tabary | 2019-07-16 |