WF

Wei Fang

AB Asml Netherlands B.V.: 1 patents #281 of 721Top 40%
HM Hermes Microvision: 1 patents #6 of 12Top 50%
📍 Milpitas, CA: #124 of 588 inventorsTop 25%
🗺 California: #14,923 of 67,890 inventorsTop 25%
Overall (2019): #108,309 of 560,194Top 20%
2
Patents 2019

Issued Patents 2019

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
10497538 Local alignment point calibration method in die inspection Kevin Liu, Fei Wang, Jack Jau, Zhaohui Guo 2019-12-03
10380731 Method and system for fast inspecting defects Jack Jau 2019-08-13