Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10429746 | Estimation of data in metrology | Alexandru ONOSE, Thomas Theeuwes | 2019-10-01 |
| 10369752 | Metrology method and apparatus, computer program and lithographic system | Adriaan Johan Van Leest | 2019-08-06 |