JW

Jen-Shiang Wang

AB Asml Netherlands B.V.: 1 patents #281 of 721Top 40%
📍 Sunnyvale, CA: #1,321 of 3,108 inventorsTop 45%
🗺 California: #27,528 of 67,890 inventorsTop 45%
Overall (2019): #418,638 of 560,194Top 75%
1
Patents 2019

Issued Patents 2019

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10296681 Process based metrology target design Guangqing Chen, Shufeng Bai, Eric Kent, Yen-Wen Lu, Paul Anthony Tuffy +3 more 2019-05-21