Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10504805 | Method of examining defects in a semiconductor specimen and system thereof | Ariel Hirszhorn | 2019-12-10 |
| 10312161 | Process window analysis | Idan Kaizerman | 2019-06-04 |
| 10190991 | Method for adaptive sampling in examining an object and system thereof | Idan Kaizerman | 2019-01-29 |