Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10504805 | Method of examining defects in a semiconductor specimen and system thereof | Yotam Sofer | 2019-12-10 |
AH
Ariel Hirszhorn
Overall (2019): #537,163 of 560,194Top 100%
1
Patents 2019