Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10082425 | Integrated chromatic confocal sensor | — | 2018-09-25 |
| 9857313 | Method and system for inspecting wafers for electronics, optics or optoelectronics | Mayeul Durand de Gevigney | 2018-01-02 |
| 9859842 | Device and method for testing a concentrated photovoltaic module | Mathieu Guilhem | 2018-01-02 |