MG

Mayeul Durand de Gevigney

US Unity Semiconductor: 1 patents #8 of 14Top 60%
Overall (2018): #322,701 of 503,207Top 65%
1
Patents 2018

Issued Patents 2018

Patent #TitleCo-InventorsDate
9857313 Method and system for inspecting wafers for electronics, optics or optoelectronics Philippe Gastaldo 2018-01-02