Issued Patents 2018
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10161977 | Circuit and method for gain measurement | Brady Yang, Wen-Shen Chou | 2018-12-25 |
| 10161976 | Output resistance testing method | Wen-Shen Chou, Po-Zeng Kang | 2018-12-25 |
| 10141934 | High speed level-shifter | Yu-Tao Yang, Wen-Shen Chou | 2018-11-27 |
| 10026725 | System for designing a semiconductor device, device made, and method of using the system | Wen-Shen Chou, Jaw-Juinn Horng | 2018-07-17 |
| 10018660 | Output resistance testing structure | Wen-Shen Chou, Po-Zeng Kang | 2018-07-10 |
| 10014870 | Micro-electro-mechanical systems (MEMS), apparatus, and operating methods thereof | Wen-Hung Huang, Yu-Wei Lin | 2018-07-03 |
| 9964987 | Integrated circuit with transistor array and layout method thereof | Ching-Ho Chang, Jaw-Juinn Horng | 2018-05-08 |
| 9921254 | Circuit and method for bandwidth measurement | Chih-Chiang Chang, Wen-Shen Chou, Brady Yang | 2018-03-20 |
| 9873100 | Integrated circuit having temperature-sensing device | Tung-Tsun Chen, Yi-Shao Liu, Jui-Cheng Huang, Chin-Hua Wen, Felix Ying-Kit Tsui | 2018-01-23 |