Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9917189 | Method for detecting presence and location of defects in a substrate | Shih-Wei Hung, Chien-Feng Lin, Zheng-Yang Pan | 2018-03-13 |
SK
Shu Kuan
Overall (2018): #240,585 of 503,207Top 50%
1
Patents 2018