Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10083838 | Methods of measuring electrical characteristics during plasma etching | Daniel Kwadwo Amponsah Berkoh, Elena Becerra Woodard | 2018-09-25 |
| 9905484 | Methods for shielding a plasma etcher electrode | Daniel Kwadwo Amponsah Berkoh, Elena Becerra Woodard | 2018-02-27 |