Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9952277 | Test device and method using single probe to test multiple pads of chip | Hung-Wei Lai | 2018-04-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9952277 | Test device and method using single probe to test multiple pads of chip | Hung-Wei Lai | 2018-04-24 |