Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9952277 | Test device and method using single probe to test multiple pads of chip | Tsung-Jun Lee | 2018-04-24 |
| 9945900 | Testing device for radio frequency front end and radio frequency front end testing method | Chih-Min Wang | 2018-04-17 |