Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10145894 | Defect screening method for electronic circuits and circuit components using power spectrum anaylysis | Joshua Beutler, Edward I. Cole, Jr., Guillermo M. Loubriel | 2018-12-04 |
| 10094874 | Scanning method for screening of electronic devices | Edward I. Cole, Jr., Guillermo M. Loubriel, Joshua Beutler | 2018-10-09 |