Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10145894 | Defect screening method for electronic circuits and circuit components using power spectrum anaylysis | Paiboon Tangyunyong, Joshua Beutler, Guillermo M. Loubriel | 2018-12-04 |
| 10094874 | Scanning method for screening of electronic devices | Paiboon Tangyunyong, Guillermo M. Loubriel, Joshua Beutler | 2018-10-09 |
| 10060973 | Test circuits for integrated circuit counterfeit detection | Ryan Helinski, Lyndon G. Pierson, Tan Q. Thai | 2018-08-28 |