Issued Patents 2018
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10048601 | Apparatus for measuring mask error and method therefor | Hak-Seung Han, Dong-Hoon Chung | 2018-08-14 |
| 9897554 | Method of inspecting surface and method of inspecting photomask using the same | Ji Hoon Na, Byung-Gook Kim, Rae-won Yi | 2018-02-20 |
| 9892884 | Exposure apparatus and method of manufacturing semiconductor device | Rae-won Yi, Byoung-Sup Ahn, Su-Young Lee | 2018-02-13 |
| 9893251 | Light-emitting device packages and methods of manufacturing the same | Jung Sub Kim, Yong-Il Kim, Kyung Wook HWANG, Jin Sub LEE, Min-gyeong Gwon | 2018-02-13 |