Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10036712 | Defect inspection system and method using an array of light sources | Mark Christoph Jaeger, Weixi Zhou | 2018-07-31 |
| 9929875 | Detection system and method and space control system using such a detection system | Guofu Zhuo, Mark Christoph Jaeger | 2018-03-27 |