Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10036712 | Defect inspection system and method using an array of light sources | SHUGUANG KUAI, Mark Christoph Jaeger | 2018-07-31 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10036712 | Defect inspection system and method using an array of light sources | SHUGUANG KUAI, Mark Christoph Jaeger | 2018-07-31 |