Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9927376 | Template defect inspection method | Tomoaki Sawabe, Shinobu Sugimura, Seiji Morita | 2018-03-27 |
| 9859119 | Self-organization material and pattern formation method | Takeshi Okino, Akira Watanabe, Naoko Kihara | 2018-01-02 |