Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10001358 | Measuring probe and measuring probe system | Kazuhiko Hidaka, Nobuyuki Hama, Sadayuki Matsumiya | 2018-06-19 |
| 9921044 | Surface property measuring apparatus and method for controlling the same | — | 2018-03-20 |