Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10001358 | Measuring probe and measuring probe system | Kazuhiko Hidaka, Tatsuki Nakayama, Sadayuki Matsumiya | 2018-06-19 |
| 9891033 | Tilt angle adjuster for form measuring device | Youhei Onodera | 2018-02-13 |