Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10145756 | Inspection of defects in a contact lens | Soon Wei Wong, Tian Poh Yew | 2018-12-04 |
| 9911666 | Apparatus and method for inspecting a semiconductor package | Ah Kow Chin, Choong Fatt Ho, Soon Wei Wong | 2018-03-06 |
| 9874436 | Hole inspection method and apparatus | Tian Poh Yew | 2018-01-23 |