Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10145756 | Inspection of defects in a contact lens | Victor Vertoprakhov, Tian Poh Yew | 2018-12-04 |
| 9911666 | Apparatus and method for inspecting a semiconductor package | Ah Kow Chin, Choong Fatt Ho, Victor Vertoprakhov | 2018-03-06 |