Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10163522 | Test line letter for embedded non-volatile memory technology | Jui-Tsung Lien, Fang-Lan Chu, Hong-Da Lin, Wei-Cheng Wu, Ku-Ning Chang | 2018-12-25 |
| 9983257 | Test line patterns in split-gate flash technology | Wei-Cheng Wu, Jui-Tsung Lien, Fang-Lan Chu, Hong-Da Lin, Ku-Ning Chang | 2018-05-29 |