Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9869712 | Method and system for detecting defects of wafer by wafer sort | Tuung Luoh, Ling Yang, Ta-Hone Yang, Kuang-Chao Chen | 2018-01-16 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9869712 | Method and system for detecting defects of wafer by wafer sort | Tuung Luoh, Ling Yang, Ta-Hone Yang, Kuang-Chao Chen | 2018-01-16 |