Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10133263 | Process condition based dynamic defect inspection | — | 2018-11-20 |
| 10014229 | Generating a wafer inspection process using bit failures and virtual inspection | George Simon, Yuezhong Du | 2018-07-03 |