Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10014229 | Generating a wafer inspection process using bit failures and virtual inspection | Poh Boon Yong, Yuezhong Du | 2018-07-03 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10014229 | Generating a wafer inspection process using bit failures and virtual inspection | Poh Boon Yong, Yuezhong Du | 2018-07-03 |