Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9989479 | System and method to determine depth for optical wafer inspection | Pavel Kolchin, Robert M. Danen | 2018-06-05 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9989479 | System and method to determine depth for optical wafer inspection | Pavel Kolchin, Robert M. Danen | 2018-06-05 |