Issued Patents 2018
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10156525 | Inspection apparatus, inspection method, and program | — | 2018-12-18 |
| 10147605 | Process of producing epitaxial substrate | Tadashi Watanabe | 2018-12-04 |
| 10056252 | Process of forming nitride semiconductor layers | Tadashi Watanabe | 2018-08-21 |
| 10036713 | Inspection apparatus, inspection method, and program | — | 2018-07-31 |